Mobile lab-on-a-chip diagnostic system

ABSTRACT

A testing system for conducting electrochemistry analysis of a specimen sample is provided. The testing system includes a testing receptacle device and a diagnostic device. The testing receptacle device includes a receptacle having an interior space defined therein and a lid configured to be secured on an upper end of the receptacle. The lid includes an opening extending into the receptacle and a cartridge slot for receiving a test sensor cartridge having a functionalized electrode strip with an electrode well contact point provided thereon. The diagnostic device is configured as a potentiostat or similar device and includes a docking port for receiving a lower end of the testing receptacle device. The testing system is configured for receiving a specimen sample through the opening in the receptacle lid and placing the specimen sample in contact with the electrode well contact point of the functionalized electrode strip.

CROSS-REFERENCE TO RELATED APPLICATIONS

This Application claims priority to U.S. Provisional Patent ApplicationSer. No. 62/831,978, filed on Apr. 10, 2019, to Sean McIntosh, entitled“Test Stand For Mobile Lab-On-A-Chip System,”, the entire disclosure ofwhich is incorporated herein by reference.

BACKGROUND OF THE INVENTION

Electrochemical technology is currently utilized to test specimensamples in order to determine the composition of the sample byidentifying the sample's wave pattern or voltammogram using anelectrochemical technique such as voltammetry, square wave voltammetry,chronoamperometry, or electrochemical impedance spectroscopy. Theseprocedures can be used to provide lab-quality trace detection ofexplosives, narcotics, toxic industrial chemicals and other chemicals,each of which have a unique electrochemical signature. Advancements inelectroanalytical instrumentation and electrochemistry technology haveincreased the accuracy and feasibility of sample testing throughelectrochemistry. However, currently employed electrochemistry testingsystems require laboratory conditions and are expensive. As a result,such systems are not typically suitable to field applications wheretesting is often desirable, for example by law enforcement, military,customs, airport security and others.

Accordingly, a need exists for improved systems and devices that canallow for practical and cost-efficient electrochemistry testing ofspecimens samples in field applications.

BRIEF SUMMARY OF THE INVENTION

The present invention is directed generally to an electrochemistrytesting system and testing device that can be used in connection withthe testing and analysis of specimen samples of unidentified materials.The electrochemistry testing system and testing device can be used toidentify unknown chemical compounds within a specimen sample bydetecting electrochemical signatures unique to the chemical compoundstherein to determine the specific identity of the specimen sample.

The electrochemistry testing system of the present invention can includea testing receptacle device and a diagnostic device. The testing systemcan further include a test sensor cartridge that is inserted into andused within the testing receptacle device. The test sensor cartridge caninclude a functionalized electrode strip having an electrode wellcontact point container thereon as commonly used in electrochemistryanalysis.

The testing receptacle device can include a receptacle and a lid forenclosing an upper end of the receptacle. The receptacle can include aperimeter sidewall and a bottom wall defining an interior space therein.The lid can include an upper lid section and a lower lid sectionconfigured to fit together and be secured onto the upper end of thereceptacle.

The receptacle can further include a swab guide configured to direct aspecimen sample inserted into the testing receptacle device toward theelectrode well contact point of the functionalized electrode stripcontained within the interior space of the receptacle. The swab guidecan include an angled surface wall extending inward from the perimetersidewall at a downward angle toward the electrode well contact point ofthe functionalized electrode strip of the test sensor cartridge. Theswab guide can further include a pair of fins or projections extendingalong the sides of the angled surface wall to define the horizontalsides of the swab guide.

The testing receptacle device lid can include openings defined througheach of the upper lid section and the lower lid section to provide acontinuous opening through the lid and into the interior space of thereceptacle. The continuous opening can be aligned with the swab guide ofthe receptacle to allow a specimen sample to be inserted through thecontinuous opening and into the swab guide toward the electrode wellcontact point of the functionalized electrode strip of the test sensorcartridge. The lower lid section can include a cartridge slot forreceiving a cartridge head portion of the test sensor cartridge andretain the test sensor cartridge within the testing receptacle device.

The diagnostic device can be configured as a diagnostic testing device,such as a potentiostat or galvanostat as commonly used inelectrochemistry. The diagnostic device can incorporate softwareprogramming and circuitry configured to carry out the testing andscanning functionality of the testing system and can include programmingthat can store a library of electrochemical signatures for differenttypes of chemicals, compounds and materials to enable the testing systemto identify the composition of specimen samples tested. The diagnosticdevice can be configured to carry out one or more electrical techniquesused with a potentiostat or galvanostat diagnostic device, includingwithout limitation, cyclic voltammetry, square wave voltammetry,electrochemical impedance spectroscopy, and chronoamperometry.

The diagnostic device can further be configured as a test stand forreceiving and holding the testing receptacle device. The diagnosticdevice can include a docking port that receives a lower end of thetesting receptacle device and retains the testing receptacle device onthe diagnostic device. The docking port can further include a connectionport that places the testing receptacle device in electroniccommunication with the diagnostic device to facilitate the transfer ofdata between the testing receptacle device and the diagnostic device forconducting electrochemical analysis.

The testing system can be configured for use with a testing swab thatcan include a swab end portion and a swab handle. The swab end portioncan have a specimen sample placed thereon and inserted into the testingreceptacle device through the continuous opening defined through thelid. The swab end portion can be traversed through the swab guide andinto contact with the electrode well contact point of the functionalizedelectrode strip. A current can then be ran through the functionalizedelectrode strip by means of the test sensor cartridge and the diagnosticdevice can carry out the electrochemistry analysis to determine thespecific identity of the specimen sample.

Other aspects and advantages of the present invention will be apparentfrom the following detailed description of the preferred embodiments ofthe accompanying drawing figures.

DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

In the accompanying drawing, which forms a part of the specification andis to be read in conjunction therewith in which like reference numeralsare used to indicate like or similar parts in the various views:

FIG. 1 is a perspective view of an electrochemistry testing system inaccordance with one embodiment of the present invention;

FIG. 2 is a perspective view of a testing receptacle device used in theelectrochemistry testing system of FIG. 1 in accordance in accordancewith one embodiment of the present invention;

FIG. 3 is an exploded perspective view of a testing receptacle deviceused in the electrochemistry testing system of FIG. 1 illustrating anupper lid section, a lower lid section, and receptacle of the testingreceptacle device in accordance with one embodiment of the presentinvention;

FIG. 4 is a top perspective view of the receptacle of the testingreceptacle device of FIG. 3 in accordance with one embodiment of thepresent invention;

FIG. 5 is a top plan view of the upper lid section of the testingreceptacle device of FIG. 3 in accordance with one embodiment of thepresent invention;

FIG. 6 is a top plan view of the lower lid section of the testingreceptacle device of FIG. 3 in accordance with one embodiment of thepresent invention;

FIG. 7 is a perspective view of a testing sensor cartridge with afunctionalized electrode strip used in the electrochemistry testingsystem of FIG. 1 in accordance with one embodiment of the presentinvention;

FIG. 8 is a perspective view of a testing swab used in theelectrochemistry testing system of FIG. 1 in accordance with oneembodiment of the present invention; and

FIG. 9 is a perspective view of a diagnostic device used in theelectrochemistry testing system of FIG. 1 in accordance with oneembodiment of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

The invention will now be described with reference to the drawingfigures, in which like reference numerals refer to like partsthroughout. For purposes of clarity in illustrating the characteristicsof the present invention, proportional relationships of the elementshave not necessarily been maintained in the drawing figures.

The following detailed description of the invention references specificembodiments in which the invention can be practiced. The embodiments areintended to describe aspects of the invention in sufficient detail toenable those skilled in the art to practice the invention. Otherembodiments can be utilized and changes can be made without departingfrom the scope of the present invention. The present invention isdefined by the appended claims and the description is, therefore, not tobe taken in a limiting sense and shall not limit the scope ofequivalents to which such claims are entitled.

The present invention is directed to an electrochemistry testing systemand testing device that can be used in connection with the testing andanalysis of specimen samples of unidentified materials. Electrochemistryis commonly used to identify unknown chemical compounds and materials bydetecting electrochemical signatures that are unique to certaincompounds and chemicals. These electrochemical signatures are uniquewave patterns or voltammogram patterns that are specific to the specificcompound or chemical and can be utilized to determine the specificidentity of the compound/chemical (and/or the components thereof). Amongmany other uses, the testing system and testing device of the presentinvention can be utilized to test for quality trace detection ofexplosives, gun powder, accelerants, narcotics, drugs and othercontrolled substances, toxic industrial chemicals, contaminants,pollutants, other chemicals, and any other compounds, substances andmaterial that can be identified through electrochemistry. Such potentialuses apply themselves to, among others, law enforcement investigations,forensic science applications, airport/travel security applications,military applications, medical and healthcare applications, agronomicand soil applications, post office/customs inspections, among otherapplications, fields, and uses. The specimen samples may include samplesfrom swabbed surfaces, dry material samples, liquid samples, chemicalsamples, urine samples, blood or other bodily fluid samples, soilsamples, or any other suitable types of specimen sample, as well ascombinations thereof.

Turning to FIG. 1 , the electrochemistry testing system 10 of thepresent invention is illustrated according to one embodiment. As shownin FIG. 1 , testing system 10 can include a testing receptacle device 12and a diagnostic device 14 that can function as a testing stand ordocking station for testing receptacle device 12 and/or as a diagnosticdevice for electrochemistry diagnostic capabilities. Testing system 10can further include a test sensor cartridge 18 (see FIGS. 2 and 7 ) thatcan be inserted into and contained within testing receptacle device 12,and a testing swab 20 (see FIGS. 2 and 8 ) that can hold a specimensample and be inserted into testing receptacle device 12 for testing asdescribed in greater detail below. As described in greater detailherein, according to certain embodiments, testing system 12 can be usedby collecting a specimen sample on a testing swab 20 and inserting theswab end 48 into testing receptacle device 12 to test the specimensample. Alternatively, the specimen sample may be contained within anoptimized liquid buffer solution (not shown) that can be poured intotesting receptacle device 12 in order to test the specimen sample.Further, it will be appreciated that a liquid specimen sample may, insome cases, be poured directly into the testing receptacle device 12without the addition of a buffer solution.

Diagnostic device test stand 14 can be configured stand for receiving,docking and/or otherwise holding testing receptacle device 12.Diagnostic device 14 can additionally or alternatively be configured asa diagnostic device, such as to include a potentiostat or galvanostat ascommonly used in electrochemistry or any other suitable testing devicenow known or hereinafter developed and configured to operate inconjunction with testing receptacle device 12. Diagnostic device 14and/or testing system 10 can additionally incorporate softwareprogramming that is configured to carry out the testing, analysis andscanning functionality of system 10 and display the testing results to auser through a computing device 16 (as further described below) or otheruser interface component as illustrated in FIG. 1 . Such programming canstore a library of electrochemical signatures for different types ofchemicals, compounds and materials to enable system 10 to identify thecomposition of specimen samples tested. Diagnostic device 14 can beconfigured to transmit a current to a test sensor cartridge 18 withintesting receptacle device 12 to test a specimen sample contained on atest swab 20 inserted into device 12 or contained in a liquid buffersolution poured into device 12 (as described in greater detail below).Diagnostic device 14 (and testing system 10 overall) can identify thecomposition of the tested specimen sample by determining theelectrochemical signature of the sample. Cyclic voltammetry, square wavevoltammetry, electrochemical impedance spectroscopy, andchronoamperometry are a few of the electrical techniques commonly usedwith a potentiostat or galvanostat diagnostic device, as incorporatedinto diagnostic device 14.

FIGS. 2-6 illustrate testing receptacle device 12 in accordance with oneembodiment of the present invention. As best shown in FIGS. 2 and 3 ,testing receptacle device 12 can include a receptacle or container 22and a lid 24 configured to fit onto the upper end of receptacle 22. Asbest shown in FIGS. 2-4 , receptacle 22 can be configured as a vile orhollow container with a perimeter sidewall 26 and enclosed bottom wall28 defining an interior space or volume 30. Receptacle 22 can furtherinclude an open upper end 32 configured to receive lid 24 and to allowaccess to the interior space 30 of receptacle 22. As shown in thefigures, receptacle 22 can be configured with a cylindrical shape;however, it is recognized that receptacle 22 can be designed andconstructed with any suitable shape depending on the particularembodiment of the present invention.

As best shown in FIGS. 2 and 4 , receptacle 22 can include swab guide 34formed within the interior space 30. Swab guide 34 can be configured toreceive a testing swab 20 and guide the testing swab 20 toward a testsensor cartridge 18 contained within receptacle 22 as described ingreater detail below. Swab guide 34 can additionally be configured toreceive a liquid buffer solution inserted into test sensor cartridge 12.Swab guide 34 can extend inward from perimeter sidewall 26 be configuredas an angled slot within interior space 30. According to one embodiment,swab guide 34 can include a pair of inwardly protruding fins orprojections 36 extending inward along the height of perimeter sidewall26 and toward the central region of interior space 30 as best shown inFIG. 4 .

As shown in FIG. 4 , swab guide 34 can further include an angled surfacewall 38 defined along the interior of perimeter sidewall 26 andcontained by fins 36 along each side of the angled surface wall 38 toguide a testing swab 20 toward the central region of the interior space30 as the testing swab 20 is inserted into receptacle 22. As best shownin FIG. 4 , angled surface wall 38 can originate near the interiorsurface of perimeter sidewall 26 toward the upper end 32 of receptacle22. Angled surface wall 38 can then extend at a downward angle towardthe lower end of receptacle 22, gradually moving closer to a central ormid-region of interior space 30. As described below, when a testing swab20 (or a liquid buffer solution) is inserted into testing receptacledevice 12, the angled surface wall 38 of swab guide 34 can force thetesting swab 20 (or a liquid buffer solution) toward a central region ofthe interior space 30 of receptacle 22 as testing swab 20 (or a liquidbuffer solution) travels further into testing receptacle device 12. Inaddition, fins 36 can restrict testing swab 20 (or a liquid buffersolution) from moving horizontally within interior space 30 ofreceptacle 22 as testing swab 20 is inserted into testing receptacledevice 12.

As further shown in FIG. 4 , receptacle 22 can include a test sensorcartridge retaining projection or wall 40 defined along the interior ofperimeter sidewall 26 opposite swab guide 34. Retaining wall 40 canextend inward from perimeter sidewall 26 toward the central region ofinterior space 30 and can be configured to hold and retain test sensorcartridge 18 in a fixed position when inserted into receptacle 22.

As best shown in FIGS. 2 and 3 , receptacle 22 can also include a lowerend construction 42 that is configured to be received within a dockingport 76 of diagnostic device 14 as described in greater detail below.Lower end construction 42 can be designed to enable testing receptacledevice 12 to be retained on diagnostic device 14 when testing system 10is in use and during storage of testing system 10. Lower endconstruction 22 can further include an electronic connection component(such as USB or similar connection) that can place testing receptacledevice 12 in electronic communication with diagnostic 14 when lower endconstruction 42 is received within docking port 76 of diagnostic device14.

As best shown in FIGS. 3, 5 and 6 , lid 24 of testing receptacle device12 can include a lower lid section 44 and an upper lid section 46collectively configured to be secured to the upper end 32 of receptacle22. As shown in FIG. 3 , lower lid section 44 and upper lid section 46can be configured as two separable components; however, according toalternative embodiments (not shown), upper lid section 46 and lower lidsection 44 can be configured as a single unitary component to form lid24. As best shown in FIGS. 3 and 6 , lower lid section 44 can include aperimeter sidewall 48 defining an upper end and lower end of lower lidsection 44. Defined within the interior of lower lid section 44 can bean opening or receiving slot 50 that extends through the interior oflower lid section 44 to provide access to the interior space 30 ofreceptacle 22 when lid 24 is secured onto the upper end 32 of receptacle22. Opening 50 can be configured to enable a testing swab 20 (or aliquid buffer solution) to be inserted through lid 24 and intoreceptacle 22 as described in greater detail below. As further shown inFIG. 6 , opening 50 can include a testing swab holder 52 configured toretain a testing swab 20 in a generally fixed position once insertedthrough opening 50 and into receptacle 22. Testing swab holder 52 can beconfigured as a rectangular protrusion extending from an interiorsidewall of lower lid section 44 and having a slot defined therethroughto hold and retain a testing swab 20.

As further shown in FIG. 6 , lower lid section 44 can include acartridge slot 54 opposite opening 50 that is configured to receive atest sensor cartridge 18 inserted and retained within the interior space30 of receptacle 22 as described in greater detail below. Cartridge slot54 can include an opening defined through the interior of lower lidsection 44 and retaining walls 56 provided on each end thereof. Asdescribed in greater detail below, a test sensor cartridge 18 can beinserted partially through cartridge slot 54 and a cartridge head 68 ofthe test sensor cartridge 18 can be retained by the retaining walls 56to secure the test sensor cartridge 18 to lid 24 when testing receptacledevice 12 is used. The cartridge head 68 of test sensor cartridge 18 canbe secured retaining walls 56 using any suitable means, includingwithout limitation, pins, screws, bolts or other suitable means, and/orcartridge head 68 can be configured to contact and rest on retainingwalls 56 without the use of any additional securement components.Cartridge slot 54 can further be configured to generally conform to theshape and dimensions of any standard test sensor cartridge design or anycartridge design desired to be used in testing system 10 so thatcartridge head 68 of test sensor cartridge 18 can be adequately retainedwithin lower lid section 44.

As best shown in FIGS. 3 and 5 , upper lid section 46 can include aperimeter sidewall 58 defining an upper end and lower end of upper lidsection 46. Defined within the interior of upper lid section 46 can bean opening or receiving slot 60 that extends through the interior ofupper lid section 46 to provide access to the interior space 30 ofreceptacle 22 when lid 24 is secured onto the upper end 32 of receptacle22. As best shown in FIG. 3 , opening 60 can generally conform to theshape of opening 50 of lower lid section 44 to form a continuous openingthrough lid 24 and enable a testing swab 20 (or a liquid buffersolution) to be inserted through both upper lid section 46 and lower lidsection 44 when lid 22 is secured onto receptacle 22.

As best shown in FIGS. 2, 3 and 5 , upper lid section 46 can furtherinclude a test sensor cartridge connection slot 62 for receiving aconnection port 64 of test sensor cartridge 18 once test sensorcartridge 18 is inserted into lower lid section 44. Connection port 64can be configured to receive an input connection for powering testingreceptacle device 12 (and specifically the test sensor cartridge 18contained therein) and transmitting data to and from test sensorcartridge 18. Connection port 64 can be configured as a standard USB,micro-USB or other suitable connection type, now known or hereafterdeveloped, depending on the particular embodiment of the presentinvention. Connection portion 64 can be configured to connect testingreceptacle device 12 (and testing sensor cartridge 18 therein) todiagnostic device 14, computing device 16 used with testing system 10and/or any other suitable device or component used with testing system10. It will be appreciated that computing device 16 may take the form ofa desktop computer, laptop computer, tablet, mobile device, cellularphone, handheld device, smart watch, or any other suitable computingdevice. It will further be appreciated that computing device 16 may beincorporated, embedded within, or otherwise form a part of thediagnostic device 14. It will further be appreciated that testingreceptacle device 12, diagnostic device 14, test sensor cartridge 18,and/or computing device 16 may, in some embodiments, be in wirelesscommunication with one another and/or other devices via Bluetooth®, aradio frequency (RF), a WiFi, 4G, LTE, 5G, infrared, Near-FieldCommunications (NFC) and/or other suitable wireless communicationtechnology.

As best shown in FIG. 3 , lower lid section 44 can positioned onto andsecured to the upper end 32 of receptacle 22. Similarly, upper lidsection 46 can be removably secured to the upper end of lower lidsection 44 to form testing receptacle device 12. Upper end 32 ofreceptacle 22 and lower lid section 44 can include any standard orsuitable interlocking means that are configured to selectively retainand secure lower lid section 44 onto upper end 32 of receptacle 22 whentesting receptacle device 12 is desired to be used. Upper lid section 46can similarly include interlocking means for selectively securing upperlid section 46 to lower lid section 44.

According to one embodiment as best illustrated in FIG. 3 , upper lidsection 46, lower lid section 44 and upper end 32 of receptacle 22 caneach include corresponding slots or openings provided along the sides ofthereof in order to receive a pin, screw or other mechanism for securinglid components 24 to receptacle 22; however, it is recognized that anysuitable interlocking means may be used in various embodiments of thepresent invention. Upper lid section 46 can be configured to beselectively removable from lower lid section 44 in order to enable theinsertion, removal and replacement of a test sensor cartridge 18positioned within testing receptacle device 18. As further illustratedin FIGS. 2 and 3 , the interlocking means used to connect upper lidsection 46 to lower lid section 44 together, and subsequently lid 24 toreceptacle 22, can also be configured to align upper lid section 46,lower lid section 44 and receptacle 22 together so that opening 60 ofupper lid section 46, opening 50 of lower lid section 44, and swab guide34 of receptacle 22 are all aligned together. This alignment can requirea testing swab 20 (or a liquid buffer solution) inserted into testingreceptacle device 12 through opening 60 to subsequently travel throughopening 50 and into swab guide 34 to facilitate proper positioning oftesting swab 20 (or a liquid buffer solution) when testing receptacledevice 12 is used.

While not shown in the figures, according to certain embodiments of thepresent invention, testing receptacle device 18 may further include acover or cap configured to be placed over opening 60 of upper lidsection 46 and secured to upper lid section 46 in order to restrict dustand other particles and materials from entering testing receptacle 12through openings 60 and 50 or upper and lower lid sections 46 and 44,respectively.

FIG. 7 illustrates a test sensor cartridge 18 configured for use intesting receptacle device 12 in accordance with one embodiment of thepresent invention. As shown in FIG. 7 , test sensor cartridge 18 caninclude a functionalized electrode sensing strip 66 configured as astandard printed electrode strip (such as those commonly used forelectromechanical testing and well known in the art). Test sensorcartridge 18 can further include a cartridge head 68 having integratedcircuitry and a sensor strip socket for receiving the functionalizedelectrode sensing strip 66. Cartridge head 68 can further includeconnection port 64 as described above in order to connect test sensorcartridge 18 (and testing receptacle device 12) to test system 10. Testsensor cartridge 18 can be configured as a standard electrode testingcartridge suitable for use in electromechanical testing know known orhereinafter developed.

As illustrated in FIG. 7 , functionalized electrode sensing strip 66 canbe inserted into the socket of cartridge head 68 to place functionalizedelectrode testing strip 66 in communication with cartridge head 68 andfurther to connect to test sensor cartridge 18 to testing system 10.Test sensor cartridge 18 can operate by sending a current to testingreceptacle device 22 from an external source used with testing system10. The current can be transmitted through test sensor cartridge 18 viaconnection port 64 of cartridge head 68 extending through connectionslot 62 of lid 24 (and subsequently functionalized electrode sensingstrip 66 connected to cartridge head 68) where the electrodes are usedto test a specimen sample placed in contact with the electrodes on thefunctionalized electrode strip 66. As further shown in FIG. 7 (as wellas FIG. 2 ), functionalized electrode strip 66 can include a visualcontact point 70 (commonly referred to as the well electrode) where aspecimen sample can be positioned in order to ensure contact with theelectrodes during testing as described in greater detail below.

FIG. 8 illustrates a testing swab 20 configured for use with testingsystem 10 in accordance with one embodiment of the present invention. Asshown, test swab 20 can include a swab end portion 72 and a handle orstick portion 74 extending from the swab end portion 72. Testing swab 20can further be configured as any suitable specimen collection swabcommonly used in the art. As described in greater detail below, whentesting system 10 is used to test a particular specimen, a specimensample can be collected on the swab end portion 72 and the swab endportion 72 can be inserted into testing receptacle device 12 by means ofthe handle portion of testing swab 20.

FIG. 9 illustrates diagnostic 14 in accordance with one embodiment ofthe present invention. As described above, diagnostic device 14 can beconfigured as diagnostic device, such as a potentiostat or galvanostatcapable of carrying out cyclic voltammetry, square wave voltammetry,electrochemical impedance spectroscopy, chronoamperometry or similarelectrical techniques. Diagnostic device 14 may configured withintegrated circuitry and connectivity to carry such potentiostat orgalvanostat functionalities. Diagnostic device 14 can be configured withone or more connection ports (see FIG. 2 ) to enable diagnostic device14 to be connected to an external power source, to be electronicallyconnected to computing device 16 (or other external computing device,display device, additional diagnostic device, or other device used withtesting system 10), to be electronically connected to testing receptacledevice 12, or any other suitable or desired component. Such connectionports may be configured as a standard USB, micro-USB or other suitableconnection type, now known or hereafter developed. Diagnostic device 14may include, or have embedded therein, other internal or externalcomponents of a computing device (such as input controls, soft or hardkeys, displays, interactive touch screen, etc.). Diagnostic device 14may also be configured with internal power source (such as batteries orthe like) and wireless capabilities to enable the wireless transmissionof data and information in addition to or in replacement of one or moreconnection ports. As set forth above, diagnostic device 14 may beadapted for wirelessly communicating with testing receptacle device 12,test sensor cartridge 18, computing device 16 and/or outer devices.

As best shown in FIG. 9 , diagnostic device 14 can be configured with areceptacle or docking port 76 positioned within a base or platformsection 78. Base section 78 may also house the internal circuitry usedin the potentiostat or galvanostat diagnostic functionalities, and/orone or more storage components for holding and storing test sensorcartridges 18, testing swabs 20 or other suitable items. Docking port 78can be configured to receive and retain lower end construction 42 ofreceptacle 22 to secure testing receptacle device 12 to diagnosticdevice 14. As best shown in FIG. 9 , docking port 76 can be configuredas a recessed well defined into the base section 78 to form an outersidewall portion that generally conforms to the shape of lower endconstruction 42 of receptacle 22 and testing receptacle device 12.Docking port 76 and lower end construction 42 of receptacle 22 can beconfigured with any suitable connectivity means to place testingreceptacle 12 and diagnostic device 14 in electronic communication whentesting receptacle 12 is positioned onto and docked within docking port76. Docking port 76 and lower end construction 42 of receptacle 22 caninclude interlocking means of any suitable type to enable testingreceptacle device 12 to remain connected to diagnostic 14 via dockingport 76. It is also recognized that diagnostic device 14 can also beconfigured to function only as a potentiostat or galvanostat diagnosticdevice that is connected to testing receptacle device 12 via connectionport 64 within testing system 10 according certain embodiments of thepresent invention.

With reference to FIGS. 1 and 2 , the use and application of testingsystem 10 (and testing receptacle device 12) will now be described ingreater detail in accordance with certain embodiments of the presentinvention. As illustrated in FIG. 2 , testing receptacle device 12 mayconfigured with a test sensor cartridge 18 place therein. As describedabove, test sensor cartridge 18 may be inserted into and positionedwithin testing receptacle device 12 by removing upper lid section 46from lower lid section 44 and inserting the functionalized electrodetest strip 66 through cartridge slot 54 of lower lid section 44. Thecartridge head 68 of testing sensor cartridge may be retained and/orsecured to retaining walls 56 of cartridge slot 58 to hold cartridgehead 68 in a fixed position. As further shown in FIG. 2 , functionalizedelectrode test strip 66 can extend vertically into interior space 30 ofreceptacle 22 such that the lower end of electrode test strip 66 isrestrained from lateral or longitudinal movement by retaining wall 40extending inward from the interior of perimeter sidewall of receptacle22. Functionalized electrode test strip 66 can also be orientated withininner space 30 of receptacle 22 so that contact point or well electrode70 faces swab guide 34 within receptacle 22. Upper lid section 46 canthen be re-secured to lower lid section 44.

As best shown in FIG. 1 , testing receptacle device 12 can be dockedinto diagnostic device 14 by placing lower end construction 42 ofreceptacle 22 into docking port 76 of diagnostic device 14, which canplace testing receptacle device 12 in electronic communication withdiagnostic device 14 (testing receptacle device 12 can alternatively beconnected to diagnostic device 14 through other wired or wirelessconnection means as described above rather than docking device 12 intodocking port 76). As further shown in FIG. 1 , testing receptacle device12 and/or diagnostic device 14 can be connected to an externalcomputing/display device 16 used with testing system 10 via theconnection ports on diagnostic device 14 and connection port 64 ontesting receptacle device 12 (via test sensor cartridge 18).

As best shown in FIG. 2 , a testing swab 20 having a specimen sample tobe tested contained on swab head portion 72 can be inserted into testingreceptacle device 12. The swab end portion 74 can be inserted throughopening 60 and corresponding opening 50 of the upper and lower lidsections 46 and 44, respectively, and into swab guide 34 located withinreceptacle 22. Swab guide 34 (via angled surface wall 38 and fins 36)requires the swab head portion 72 of testing swab 20 to move toward thelower central region of receptacle 22 and adjacent test sensing strip66. Once testing swab 20 is fully inserted into testing receptacledevice 12, swab guide 34 places the swab end portion 72 in contact withthe contact point 70 of electrode test strip 66. A current can then beran through test sensor cartridge 18 (via connection port 64 and testingreceptacle device 12) to test the specimen sample on swab end 72 bymeans of its physical contact with contact point 70 to determine theelectrochemical signature of the specimen sample. The electrochemicalsignature and test data can be transmitted to diagnostic device 14(which is configured as a potentiostat or galvanostat diagnostic device)to determine the composition of the specimen sample by means of cyclicvoltammetry, square wave voltammetry, electrochemical impedancespectroscopy, and chronoamperometry or other suitable electricaltechniques as commonly known in the art.

In an alternative application and use of testing system 10, instead ofplacing the specimen sample to be tested on a testing swab 20, thespecimen sample may be combined with a buffer solution and poured ordrop-cast into testing receptacle device 12 (via corresponding openings60 and 50 of lid 24) so that the solution containing the specimen samplecontacts well electrode contact point 70 of functionalized electrodetest strip 60 and the test may be carried out using the same stepsdescribed above.

From the foregoing, it will be seen that this invention is one welladapted to attain all the ends and objects hereinabove set forthtogether with other advantages which are obvious and which are inherentto the structure. It will be understood that certain features and subcombinations are of utility and may be employed without reference toother features and sub combinations. This is contemplated by and iswithin the scope of the claims. Since many possible embodiments of theinvention may be made without departing from the scope thereof, it isalso to be understood that all matters herein set forth or shown in theaccompanying drawings are to be interpreted as illustrative and notlimiting.

The constructions described above and illustrated in the drawings arepresented by way of example only and are not intended to limit theconcepts and principles of the present invention. Thus, there has beenshown and described several embodiments of a novel invention. As isevident from the foregoing description, certain aspects of the presentinvention are not limited by the particular details of the examplesillustrated herein, and it is therefore contemplated that othermodifications and applications, or equivalents thereof, will occur tothose skilled in the art. The terms “having” and “including” and similarterms as used in the foregoing specification are used in the sense of“optional” or “may include” and not as “required”. Many changes,modifications, variations and other uses and applications of the presentconstruction will, however, become apparent to those skilled in the artafter considering the specification and the accompanying drawings. Allsuch changes, modifications, variations and other uses and applicationswhich do not depart from the spirit and scope of the invention aredeemed to be covered by the invention which is limited only by theclaims which follow.

What is claimed is:
 1. A testing system for facilitating anelectrochemistry test of a specimen sample, the testing systemcomprising: a testing receptacle device comprising: a receptacle havinga perimeter sidewall defining an interior space; a swab guide disposedwithin the interior space; the swab guide comprising an angled surfacewall extending inward from an interior of the perimeter sidewall; and alid configured to enclose an upper end of said receptacle, said lidhaving a continuous opening extending vertically through said lid, and acartridge slot defined within the lid, the cartridge slot configured forreceiving and retaining a test sensor cartridge positioned within saidreceptacle, the test sensor cartridge including a cartridge head and afunctionalized electrode strip having an electrode well contact point atone end thereof; wherein the swab guide is configured to receive aspecimen sample through the continuous opening of the lid and guide thespecimen sample to a region of the interior space such that the specimensample is placed in contact with the electrode well contact point of thefunctionalized electrode strip; wherein the testing system is configuredto transmit an electrical current through the functionalized electrodestrip for electrochemical analysis of the specimen sample.
 2. Thetesting system of claim 1 further comprising a diagnostic devicecomprising a potentiostat, wherein said diagnostic device includes adocking port for receiving a lower end construction of said receptacle.3. The testing system of claim 1, wherein said electrode well contactpoint of said functionalized electrode strip is positioned adjacent to alower end of said swab guide.
 4. The testing system of claim 1, whereinsaid swab guide is configured to receive a testing swab inserted throughsaid continuous opening of said lid and guide said testing swab to saidelectrode well contact point of said functionalized electrode strip,wherein said testing swab contains said specimen sample thereon.
 5. Thetesting system of claim 1, wherein said swab guide is configured toreceive a liquid buffer solution inserted through said continuousopening of said lid and guide said liquid buffer solution to saidelectrode well contact point of said functionalized electrode strip,wherein said liquid buffer solution contains said specimen sampletherein.
 6. The testing system of claim 1, wherein the angled surfacewall extends inward at an angle toward said electrode well contact pointof said functionalized electrode strip.
 7. The testing system of claim6, wherein said swab guide further comprises fins provided on each sideof said angled surface wall.
 8. The testing system of claim 1, whereinsaid swab guide is aligned with said continuous opening of said lid. 9.The testing system of claim of claim 1, wherein said lid comprises anupper lid section and a lower lid section, wherein said upper lidsection is removable from said lower lid section, and wherein saidcartridge slot is defined within said lower lid section.
 10. The testingsystem of claim 9, wherein said cartridge slot includes retaining wallsfor receiving and retaining said cartridge head of said test sensorcartridge.
 11. The testing system of claim 10, wherein said upper lidsection includes a connection port slot configured for receiving aconnection port located on said cartridge head of said test sensorcartridge.
 12. The testing system of claim 11, wherein said connectionport of said test sensor cartridge is configured for connecting saidtesting receptacle device to a display device.
 13. The testing system ofclaim 2, wherein said diagnostic device is configured for carrying outcyclic voltammertry, square wave voltammertry, electrochemical impedencespectrospcopy, chronoampemetry or similar electrical techniques.
 14. Thetesting system of claim 2, wherein said docking port is configured forplacing said testing receptacle device in electronic communication withsaid diagnostic device.
 15. The testing system of claim 1, wherein saidreceptacle includes a retaining wall extending inward from an interiorof said perimeter wall of said receptacle, wherein said retaining wallis configured for retaining said functionalized electrode strip in afixed position.
 16. A method of using the testing system of claim 1, themethod comprising the steps of: obtaining a specimen sample on a testingswab; inserting a test sensor cartridge into the cartridge slot of thelid to position the functionalized electrode strip of the test sensorcartridge within the interior space of the receptacle; inserting thetesting swab through the continuous opening of the lid; guiding, withthe swab guide, the testing swab to a region of the interior space ofthe receptacle such that the testing swab is placed in contact with theelectrode well contact point of the functionalized electrode strip; andusing an electrochemical diagnostic technique on the functionalizedelectrode strip for electrochemical analysis of said specimen sample.